Data Mining and Diagnosing IC Fails: 31 (Frontiers in - download pdf or read online

By Leendert M. Huisman

ISBN-10: 0387249931

ISBN-13: 9780387249933

ISBN-10: 1441937676

ISBN-13: 9781441937674

there are various ideas for reading IC fails, yet they're scattered over the pro IC try out and prognosis literature, and in a variety of facts and knowledge mining handbooks. additionally, many information mining options which are usual in different info research environments, and which are acceptable for examining IC fails, haven't but been hired for that objective. facts Mining and Diagnosing IC Fails addresses the matter of acquiring greatest info from (functional) built-in circuit fail facts in regards to the defects that brought on the fails. It starts off on the optimum point from mere kind codes, and drills down through quite a few info mining suggestions to targeted good judgment prognosis. a few of the ways mentioned during this publication have an intensive theoretical underpinning, yet are geared in the direction of purposes on genuine existence fail information and cutting-edge ICs. This ebook brings jointly lots of research suggestions which are appropriate for IC fail facts, yet that aren't on hand somewhere else in one position. a number of of the thoughts, actually, were awarded just recently in technical meetings. the aim of the e-book is to compile in a single position a good number of research, information mining and prognosis ideas that experience confirmed to be invaluable in examining IC fails. The descriptions of the thoughts and research workouts is adequately certain that pro production engineers can enforce them of their personal paintings environment.

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Data Mining and Diagnosing IC Fails: 31 (Frontiers in Electronic Testing) by Leendert M. Huisman


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